Probes for Scanning Thermal Microscopy (SThM).
Scanning Thermal Microscopy (SThM) is an advanced SPM mode intended for simultaneous obtaining nanoscale thermal and topography images. SThM mode of operation with an AFM requires a specialized probe with a resistor built into the cantilever. SThM module allows one to monitor the resistance changes correlated with the temperature at the end of the probe. So the system is able to monitor relative changes of sample temperature and thermal conductivity. Such thermal probes provide better than 100 nm lateral resolution for both topography and thermal images.
The specialized SThM cantilever, made of SiO2 with a thin metal layer, is deposited on the probe in such a way that the highest resistance portion of the layer is concentrated near the tip apex.